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Title:Diagnosis study of defect symptoms-reason of die-drawing on simulated annealing genetic algorithm
Authors: LIU Zhan-jun  ZHANG Ling-yun  HE ping  (Shenyang Institute of Aeronautical Engineering) 
Unit:  
KeyWords: test die-drawing  Simulated annealing genetic algorithm  Defect analysis 
ClassificationCode:TG386
year,vol(issue):pagenumber:2004,29(4):66-68
Abstract:
The defect symptoms-reason table of test die-drawing is concluded. Using simulated annealing genetic algorithm does a kind of nonlinear optimation to the defect of test die-drawing. It greatly improves the method of convergence on using the adaptive stretch. A diagnosis of simulated annealing genetic algorithm is constructed.
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Reference:
1 吴今培,肖健华智能故障诊断与专家系统北京:科学出版社,1997
2 陈国良等遗传算法及其应用北京:人民邮电出版社,1996
3 黄毅宏模具制造工艺北京:机械工业出版社,1988
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